Stephen Buchner: search on Z-Library

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1

Applications of the blowing-up construction and algebraic geometry to bifurcation problems

Michael Buchner, Jerrold Marsden, Stephen Schecter

Journal:

Journal of Differential Equations

Year:

1983

Language:

english

File:

PDF, 1.60 MB

english, 1983

2

Single-Event Transients in Bipolar Linear Integrated Circuits

Buchner, Stephen, McMorrow, Dale

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.13 MB

english, 2006

3

Evaluating the Effects of Single Event Transients in FET-Based Single-Pole Double-Throw RF Switches

Cardoso, Adilson S., Chakraborty, Partha S., Lourenco, Nelson E., England, Troy D., Saha, Prabir, Howard, Duane C., Fleischhauer, David M., Warner, Jeffrey H., McMorrow, Dale, Buchner, Stephen P., Pak

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1.89 MB

english, 2014

4

[IEEE 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Cap d'Agde, France (2005.09.19-2005.09.23)] 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Laser-Induced Latchup Screening and Mitigation in CMOS Devices

McMorrow, Dale, Buchner, Stephen, Baze, Mark, Bartholet, Bill, Katz, Richard, O'Bryan, Martha, Poivey, Christian, Label, Kenneth A., Ladbury, Ray, Maher, Mike, Sexton, Fred

Year:

2005

Language:

english

File:

PDF, 3.80 MB

english, 2005

5

Impact of Cumulative Irradiation Degradation and Circuit Board Design on the Parameters of ASETs Induced in Discrete BJT-based Circuits

Roche, Nicolas J.-H., Khachatrian, Ani, Buchner, Stephen P., Warner, J. H., Hughes, Harold, McMarr, Patrick, McMorrow, Dale

Journal:

IEEE Transactions on Nuclear Science

Year:

2015

Language:

english

File:

PDF, 1.95 MB

english, 2015

6

Spatial Mapping of Pristine and Irradiated AlGaN/GaN HEMTs with UV Single-Photon Absorption Single-Event Transient Technique

Khachatrian, Ani, Roche, Nicolas J-H., Buchner, Stephen P., Koehler, Andrew D., Greenlee, Jordan D., Anderson, Travis J., Warner, Jeffrey H., McMorrow, Dale

Journal:

IEEE Transactions on Nuclear Science

Year:

2016

Language:

english

File:

PDF, 1.28 MB

english, 2016

7

High Voltage GaN Lateral Photoconductive Semiconductor Switches

Koehler, Andrew D., Anderson, Travis J., Khachatrian, Ani, Nath, Anindya, Tadjer, Marko J., Buchner, Stephen P., Hobart, Karl D., Kub, Fritz J.

Journal:

ECS Journal of Solid State Science and Technology

Year:

2017

Language:

english

File:

PDF, 426 KB

english, 2017

8

Experimental Validation of an Equivalent LET Approach for Correlating Heavy-Ion and Laser-Induced Charge Deposition

Hales, Joel M., Khachatrian, Ani, Buchner, Stephen, Roche, Nicolas J.-H., Warner, Jeffrey, Fleetwood, Zachary E., Ildefonso, Adrian, Cressler, John D., Ferlet-Cavrois, Veronique, McMorrow, Dale

Journal:

IEEE Transactions on Nuclear Science

Year:

2018

Language:

english

File:

PDF, 671 KB

english, 2018

9

Mitigation of Single-Event Effects in SiGe-HBT Current-Mode Logic Circuits

Sarker, Md Arifur R., Jung, Seungwoo, Ildefonso, Adrian, Khachatrian, Ani, Buchner, Stephen P., McMorrow, Dale, Paki, Pauline, Cressler, John D., Song, Ickhyun

Journal:

Year:

2020

File:

PDF, 1.57 MB

2020

10

ChemInform Abstract: Ion-Pair and Solvent Relaxation Processes in Aqueous Na2SO4 Solutions.

Richard Buchner, Stephen G. Capewell, Glenn Hefter, Peter M. May

Journal:

Year:

1999

File:

PDF, 31 KB

1999

11

Hepatitis B and the dental profession: response to hepatitis B vaccine in Canadian dental personnel. A study by the Canadian Red Cross Collaborative Group

R.P. Bryce Larke, Sylvia A. Bouchard, Barbara K. Buchner, John B. Derrick, J. Brian McSheffrey, Stephen I. Vas

Journal:

Journal of Infection

Year:

1983

Language:

english

File:

PDF, 414 KB

english, 1983

12

Transient charge collection from ion tracks in semiconductors

Dale McMorrow, Arthur B. Campbell, Alvin R. Knudson, Stephen Buchner, Todd R. Weatherford

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

1992

Language:

english

File:

PDF, 458 KB

english, 1992

13

Total Dose Effect on the Propagation of Single Event Transients in a CMOS Inverter String

Buchner, Stephen, Sibley, Michael, Eaton, Paul, Mavis, David, McMorrow, Dale

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 203 KB

english, 2010

14

[IEEE 2009 IEEE Radiation Effects Data Workshop (in Conjunction with NSREC 2009) - Quebec, Canada (2009.07.20-2009.07.24)] 2009 IEEE Radiation Effects Data Workshop - Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

O'Bryan, Martha V., LaBel, Kenneth A., Pellish, Jonathan A., Buchner, Stephen P., Ladbury, Ray L., Oldham, Timothy R., Kim, Hak S., Campola, Michael J., Lauenstein, Jean-Marie, Chen, Dakai, Berg, Mela

Year:

2009

Language:

english

File:

PDF, 5.41 MB

english, 2009

15

[IEEE 2006 IEEE Radiation Effects Data Workshop - Ponte Vedra Beach, FL, USA (2006.07.17-2006.07.21)] 2006 IEEE Radiation Effects Data Workshop - Compendium of Single Event Effects Results for Candidate Spacecraft Electronics for NASA

O'Bryan, Martha, Poivey, Christian, Kniffin, Scott, Buchner, Stephen, Ladbury, Ray, Oldham, Timothy, Howard, James, LaBel, Kenneth, Sanders, Anthony, Berg, Melanie, Marshall, Cheryl, Marshall, Paul, K

Year:

2006

Language:

english

File:

PDF, 7.04 MB

english, 2006

16

[IEEE 2006 IEEE Radiation Effects Data Workshop - Ponte Vedra Beach, FL, USA (2006.07.17-2006.07.21)] 2006 IEEE Radiation Effects Data Workshop - Compendium of Total Ionizing Dose Results and Displacement Damage Results for Candidate Spacecraft Electronics for NASA

Cochran, Donna, Kniffin, Scott, Buchner, Stephen, LaBel, Kenneth, O'Bryan, Martha, Ladbury, Raymond, Sanders, Anthony, Hawkins, Donald, Cox, Stephen, Poivey, Christian, Oldham, Timothy, Kim, Hak, Irwi

Year:

2006

Language:

english

File:

PDF, 5.82 MB

english, 2006

17

[IEEE 2008 IEEE Radiation Effects Data Workshop - Tucson, AZ (2008.07.14-2008.07.18)] 2008 IEEE Radiation Effects Data Workshop - Compendium of Recent Single Event Effects Results for Candidate Spacecraft Electronics for NASA

O'Bryan, Martha V., LaBel, Kenneth A., Buchner, Stephen P., Ladbury, Ray L., Poivey, Christian F., Oldham, Timothy R., Campola, Michael J., Carts, Martin A., Berg, Melanie D., Sanders, Anthony B., Mac

Year:

2008

Language:

english

File:

PDF, 786 KB

english, 2008

18

Examples for the Infinite Dimensional Morse Lemma

Buchner, Michael, Marsden, Jerrold, Schecter, Stephen

Journal:

SIAM Journal on Mathematical Analysis

Year:

1983

Language:

english

File:

PDF, 1.11 MB

english, 1983

19

Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing Techniques

Schwank, James R., Shaneyfelt, Marty R., Dodd, Paul E., McMorrow, Dale, Vizkelethy, Gyorgy, Ferlet-Cavrois, Véronique, Gouker, Pascale M., Flores, Richard S., Stevens, Jeffrey, Buchner, Stephen B., Da

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 553 KB

english, 2011

20

[IEEE 2010 Radiation Effects Data Workshop - denver, CA, USA (2010.07.20-2010.07.23)] 2010 IEEE Radiation Effects Data Workshop - Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

Cochran, Donna J., Chen, Dakai, Oldham, Timothy R., Sanders, Anthony B., Kim, Hak S., Campola, Michael J., Buchner, Stephen P., LaBel, Kenneth A., Marshall, Cheryl J., Pellish, Jonathan A., Carts, Mar

Year:

2010

Language:

english

File:

PDF, 267 KB

english, 2010

21

Ion-Pair and Solvent Relaxation Processes in Aqueous Na 2 SO 4 Solutions

Buchner, Richard, Capewell, Stephen G., Hefter, Glenn, May, Peter M.

Journal:

Journal of Physical Chemistry B

Year:

1999

Language:

english

File:

PDF, 108 KB

english, 1999

22

A New Approach for Single-Event Effects Testing With Heavy Ion and Pulsed-Laser Irradiation: CMOS/SOI SRAM Substrate Removal

Kanyogoro, Nderitu, Buchner, Stephen, McMorrow, Dale, Hughes, Harold, Liu, Michael S., Hurst, Al, Carpasso, Charles

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 376 KB

english, 2010

23

Evaluating the Influence of Various Body-Contacting Schemes on Single Event Transients in 45-nm SOI CMOS

Moen, Kurt A., Phillips, Stanley D., Wilcox, Edward P., Cressler, John D., Nayfeh, Hasan, Sutton, Akil K., Warner, Jeffrey H., Buchner, Stephen P., McMorrow, Dale, Vizkelethy, Gyorgy, Dodd, Paul

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 775 KB

english, 2010

24

[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - SEE and TID Results for Commercial Non-Optogalvanic Isolators for Space Application

Jacobson, Mark A., Buchner, Stephen P., Hughes, Harold L., McMarr, Patrick J.

Year:

2010

Language:

english

File:

PDF, 2.74 MB

english, 2010

25

Investigation and Mitigation of Analog SET on a Bandgap Reference in Triple-Well CMOS Using Pulsed Laser Techniques

Zanchi, Alfio, Buchner, Stephen, Hafer, Craig, Hisano, Shinichi, Kerwin, David B.

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 1.14 MB

english, 2011

26

[IEEE 2007 IEEE Radiation Effects Data Workshop - (2007.07.23-2007.07.27)] 2007 IEEE Radiation Effects Data Workshop - Compendium of Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA

O'Bryan, Martha V., Poivey, Christian F., LaBel, Kenneth A., Buchner, Stephen P., Ladbury, Ray L., Oldham, Timothy R., Howard, James W., Sanders, Anthony B., Berg, Melanie D., Titus, Jeffrey L.

Year:

2007

Language:

english

File:

PDF, 1.39 MB

english, 2007

27

Correlation of Pulsed-Laser Energy and Heavy-Ion LET by Matching Analog SET Ensemble Signatures and Digital SET Thresholds

Zanchi, Alfio, Buchner, Stephen, Lotfi, Younes, Hisano, Shinichi, Hafer, Craig, Kerwin, David B.

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 1.39 MB

english, 2013

28

An Investigation of Single Event Transient Response in 45-nm and 32-nm SOI RF-CMOS Devices and Circuits

England, Troy D., Arora, Rajan, Fleetwood, Zachary E., Lourenco, Nelson E., Moen, Kurt A., Cardoso, Adilson S., McMorrow, Dale, Roche, Nicolas J.-H., Warner, Jeffery H., Buchner, Stephen P., Paki, Pau

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 1.10 MB

english, 2013

29

Single-Event Upsets in Substrate-Etched CMOS SOI SRAMs Using Ultraviolet Optical Pulses With Sub-Micrometer Spot Size

McMorrow, Dale, Khachatrian, Ani, Roche, Nicolas J.-H., Warner, Jeffrey H., Buchner, Stephen P., Kanyogoro, Nderitu, Melinger, Joseph S., Pouget, Vincent, Larue, Camille, Hurst, Alan, Kagey, Dan

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 1.14 MB

english, 2013

30

Proton-Induced Transient Charge Collection in GaAs and InAlSb/InAs-Based FETs

Warner, Jeffrey H., McMorrow, Dale, Buchner, Stephen, Boos, J. Brad, Roche, Nicolas, Paillet, Philippe, Gaillardin, Marc, Blackmore, Ewart, Trinczek, Michael, Ramachandran, Vishwa, Reed, Robert A., Sc

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 1.27 MB

english, 2013

31

An Investigation of Single-Event Effects and Potential SEU Mitigation Strategies in Fourth-Generation, 90 nm SiGe BiCMOS

Lourenco, Nelson E., Phillips, Stanley D., England, Troy D., Cardoso, Adilson S., Fleetwood, Zachary E., Moen, Kurt A., McMorrow, Dale, Warner, Jeffrey H., Buchner, Stephen P., Paki-Amouzou, Pauline,

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 1.25 MB

english, 2013

32

Ion-Induced Charge-Collection Transients in p-Channel AlGaSb/InGaSb Heterojunction Field-Effect Transistors

Warner, Jeffrey H., McMorrow, Dale, Buchner, Stephen, Boos, J. Brad, Bennett, Brian R., Cress, Cory D., Champlain, James G., Roche, Nicolas J.-H., Paillet, Philippe, Gaillardin, Marc

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1.02 MB

english, 2014

33

[IEEE 2008 IEEE Radiation Effects Data Workshop - Tucson, AZ (2008.07.14-2008.07.18)] 2008 IEEE Radiation Effects Data Workshop - Compendium of Recent Total Ionizing Dose Results for Candidate Spacecraft Electronics for NASA

Cochran, Donna J., Buchner, Stephen P., Sanders, Anthony B., LaBel, Kenneth A., Carts, Martin A., Poivey, Christian F., Oldham, Timothy R., Ladbury, Raymond L., O'Bryan, Martha V., Mackey, Susan R.

Year:

2008

Language:

english

File:

PDF, 512 KB

english, 2008

34

[IEEE 2009 IEEE Radiation Effects Data Workshop (in Conjunction with NSREC 2009) - Quebec, Canada (2009.07.20-2009.07.24)] 2009 IEEE Radiation Effects Data Workshop - Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

Cochran, Donna J., Buchner, Stephen P., Chen, Dakai, Kim, Hak S., LaBel, Kenneth A., Oldham, Timothy R., Campola, Michael J., O'Bryan, Martha V., Ladbury, Raymond L., Marshall, Cheryl, Sanders, Anthon

Year:

2009

Language:

english

File:

PDF, 785 KB

english, 2009

35

Total Dose Effects on Error Rates in Linear Bipolar Systems

Buchner, Stephen, McMorrow, Dale, Bernard, Muriel, Roche, Nicolas, Dusseau, Laurent

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 610 KB

english, 2008

36

Dielectric relaxation of aqueous Na2CO3 solutions

Capewell, Stephen G., Buchner, Richard, Hefter, Glenn, May, Peter M.

Journal:

Physical Chemistry Chemical Physics

Year:

1999

Language:

english

File:

PDF, 123 KB

english, 1999

37

TPA Laser and Heavy-Ion SEE Testing: Complementary Techniques for SDRAM Single-Event Evaluation

Ladbury, Ray L., Benedetto, Joe, McMorrow, Dale, Buchner, Stephen P., Label, Kenneth A., Berg, Melanie D., Kim, Hak S., Sanders, Anthony B., Friendlich, Mark R., Phan, Anthony

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 1.61 MB

english, 2009

38

Likelihood of a subsequent chemotherapy-induced nausea and vomiting (CINV) event in patients receiving low, moderately or highly emetogenic chemotherapy (LEC/MEC/HEC)

Schwartzberg, Lee, Szabo, Stephen, Gilmore, James, Haislip, Sally, Jackson, James, Jain, Gagan, Balu, Sanjeev, Buchner, Deborah

Journal:

Current Medical Research and Opinion

Year:

2011

Language:

english

File:

PDF, 235 KB

english, 2011

39

SEL Induced Latent Damage, Testing, and Evaluation

Layton, Phil, Kniffin, Scott, Guertin, Steven, Swift, Gary, Buchner, Stephen

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.74 MB

english, 2006

40

Accelerated Irradiation Method to Study Synergy Effects in Bipolar Integrated Circuits

Roche, Nicolas Jean-Henri, Gonzalez Velo, Yago, Dusseau, Laurent, Boch, JÉrÔme, Vaille, Jean-Roch, Saigne, FrÉdÉric, Azais, Bruno, Auriel, GÉrard, Lorfevre, Eric, Pouget, Vincent, Buchner, Stephen P.,

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 2.48 MB

english, 2009

41

The Effects of Low Dose-Rate Ionizing Radiation on the Shapes of Transients in the L>M124 Operational Amplifier

Buchner, Stephen, McMorrow, Dale, Roche, Nicholas, Dusseau, Laurent, Pease, Ron L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 713 KB

english, 2008

42

[IEEE 2007 9th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2007) - Deauville, France (2007.09.10-2007.09.14)] 2007 9th European Conference on Radiation and Its Effects on Components and Systems - Total dose effects on error rates in linear bipolar systems

Buchner, Stephen, McMorrow, Dale, Bernard, Muriel, Roche, Nicolas, Dusseau, Laurent

Year:

2007

Language:

english

File:

PDF, 4.60 MB

english, 2007

43

[IEEE 2007 IEEE Radiation Effects Data Workshop - (2007.07.23-2007.07.27)] 2007 IEEE Radiation Effects Data Workshop - Compendium of Current Total Ionizing Dose Results and Displacement Damage Results for Candidate Spacecraft Electronics for NASA

Cochran, Donna J., Buchner, Stephen P., Poivey, Christian, LaBel, Kenneth A., Ladbury, Ray L., O'Bryan, Martha, Howard, James W., Sanders, Anthony, Oldham, Timothy

Year:

2007

Language:

english

File:

PDF, 751 KB

english, 2007

44

Response of a MEMS Microshutter Operating at 60 K to Ionizing Radiation

Buchner, S., Rapchun, David A., Moseley, Harvey, Meyer, Stephen E., Oldham, Tim, Ray, Knute, Tuttle, Jim, Quinn, Ed, Buchanan, Ernie, Bloom, Dave, Hait, Tom, Pearce, Mike, Beamer, A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 1.31 MB

english, 2007

45

Pulsed laser-induced single event upset and charge collection measurements as a function of optical penetration depth

Melinger, Joseph S., McMorrow, Dale, Campbell, A. B., Buchner, Stephen, Tran, Lan Hu, Knudson, A. R., Curtice, W. R.

Journal:

Journal of Applied Physics

Year:

1998

Language:

english

File:

PDF, 626 KB

english, 1998

46

Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing

Berg, Melanie D., Buchner, Stephen P., Kim, Hak, Friendlich, Mark, Perez, Christopher, Phan, Anthony M., Seidleck, Christina M., Label, Kenneth A., Kruckmeyer, Kirby

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 748 KB

english, 2010

47

Single-Event Effect Performance of a Commercial Embedded ReRAM

Chen, Dakai, Kim, Hak, Phan, Anthony, Wilcox, Edward, LaBel, Kenneth, Buchner, Stephen, Khachatrian, Ani, Roche, Nicolas

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1.62 MB

english, 2014

48

[IEEE 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Oxford, United Kingdom (2013.9.23-2013.9.27)] 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Ion-induced charge-collection transients in p-channel AlGaSb/InGaSb field-effect transistors

Warner, Jeffrey H., McMorrow, Dale P., Buchner, Stephen, Boos, J. Brad, Bennett, Brian R., Cress, Cory D., Champlain, James G., Roche, Nicolas, Paillet, Philippe, Gaillardin, Marc

Year:

2013

Language:

english

File:

PDF, 1.53 MB

english, 2013

49

On the Transient Response of a Complementary (npn $+$ pnp) SiGe HBT BiCMOS Technology

Lourenco, Nelson E., Fleetwood, Zachary E., Jung, Seungwoo, Cardoso, Adilson S., Chakraborty, Partha S., England, Troy D., Roche, Nicolas J.-H., Khachatrian, Ani, McMorrow, Dale, Buchner, Stephen P.,

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1.92 MB

english, 2014

50

The Effects of Elevated Temperature on Pulsed-Laser-Induced Single Event Transients in Analog Devices

Chen, Dakai, Buchner, Stephen P., Phan, Anthony M., Kim, Hak S., Sternberg, Andrew L., McMorrow, Dale, LaBel, Kenneth A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 956 KB

english, 2009